Chinese expert invents device to measure electron activity

NEW YORK - A Chinese scientist working in the United States has invented a new device to measure the behavior of electrons in materials, which will help improve the performance and energy efficiency of electronic devices, microchips and sensors used in the IT and tech sectors.

His findings have been independently verified by leading players in industry and academia, including General Motors and Columbia University, and the detection device will potentially be adopted by IBM, Tang Shuang told reporters in New York on July 14.

The results were reported in Tang's article Extracting the Energy Sensitivity of Charge Carrier Transport and Scattering, which was published in Scientific Reports, an online journal published by Nature, on July 13.